Abstract
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Full Crystallographic Imaging of Hexagonal Boron Nitride Monolayerswith Phonon-Enhanced Sum-Frequency Microscopy
Niclas S. Mueller, Alexander P. Fellows, Ben John, Andrew E. Naclerio, Christian Carbogno,Katayoun Gharagozloo-Hubmann, Damián Baláž, Ryan A. Kowalski, Hendrik H. Heenen, ChristophScheurer, Karsten Reuter, Joshua D. Caldwell, Martin Wolf, Piran R. Kidambi, Martin Thämer,Alexander Paarmann
published in Advanced Materials
DOI: https://doi.org/10.1002/adma.202510124
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